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Defect Detection>
  Applications
    Vivaldi Array
    Packaging
    Point Radiation Antenna
    Aircraft
    Bio-Electromagnetic
    Antenna Array
    Rotman Lens
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    Defect Detection
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    EM Interecence
    Magnetic Resonance
            Imaging
    Cluster of Spheres
    Band Pass Filter
    Multiscale Problem
    Patch Antnena Array
    Car Improvement

During the manufacture of chips, the defects will significantly affect the performance of the chips. In the example, we use the GEMS Simulator to simulate the different defects in the chip manufacture. The computational domain is divided into 800 x 1100 x 250 non-uniform cells. It took 35 minutes for GEMS HPCC system to simulate it for 5000 time steps. (Visual Demo)

Defect Type I Field Distribution for Plane Wave Incidence
Power Density Defect Type II
Field Distribution for Plane Wave Incidence Power Density
   
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